On October 19th, the workshop "Future Proof Methods for Measuring and Detecting Dark Patterns" took place on behalf of Utrecht University. During this workshop, keynote speaker Colin M. Gray first gave a lecture on the methodological landscape of dark patterns detection. In the second part of the workshop, the panel discussed several future proof methods for measuring and detecting dark patterns and answered questions from the audience. The panel consisted of Colin M. Gray (Purdue University), Gunes Acar (Radboud University, iHub), Dries Cuijpers (Netherlands Authority for Consumers and Markets), Christof Nimwegen (Utrecht University), Arianna Rossi (University of Luxembourg), and Marijn Sax (University of Amsterdam). Thanks a lot to the organizers for this interesting workshop!